%0 Journal Article %1 journals/mr/SowarirajSSMK03 %A Sowariraj, M. S. B. %A Smedes, Theo %A Salm, Cora %A Mouthaan, Ton J. %A Kuper, Fred G. %D 2003 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1569-1575 %T Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#SowarirajSSMK03 %V 43

@article{journals/mr/SowarirajSSMK03, added-at = {2021-10-14T00:00:00.000+0200}, author = {Sowariraj, M. S. B. and Smedes, Theo and Salm, Cora and Mouthaan, Ton J. and Kuper, Fred G.}, biburl = {https://www.bibsonomy.org/bibtex/25ecbf102f56efc60d1a1ad906a66a597/dblp}, ee = {https://doi.org/10.1016/S0026-2714(03)00276-2}, interhash = {f98370a22da702032db5f96ab113e5f0}, intrahash = {5ecbf102f56efc60d1a1ad906a66a597}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1569-1575}, timestamp = {2024-04-09T02:48:37.000+0200}, title = {Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#SowarirajSSMK03}, volume = 43, year = 2003 }