%0 Journal Article %1 journals/mr/BychikhinHRVGP10 %A Bychikhin, Sergey %A Haberfehlner, Georg %A Rhayem, J. %A Vanderstraeten, Daniel %A Gillon, Renaud %A Pogany, Dionyz %D 2010 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1427-1430 %T Investigation of smart power DMOS devices under repetitive stress conditions using transient thermal mapping and numerical simulation. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#BychikhinHRVGP10 %V 50

@article{journals/mr/BychikhinHRVGP10, added-at = {2020-11-05T00:00:00.000+0100}, author = {Bychikhin, Sergey and Haberfehlner, Georg and Rhayem, J. and Vanderstraeten, Daniel and Gillon, Renaud and Pogany, Dionyz}, biburl = {https://www.bibsonomy.org/bibtex/25f39c9ab7c4e76d88c881f095a4dc99e/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.07.138}, interhash = {9a9f560248c9ea9bfec1f006fa4fc963}, intrahash = {5f39c9ab7c4e76d88c881f095a4dc99e}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1427-1430}, timestamp = {2020-11-06T11:35:33.000+0100}, title = {Investigation of smart power DMOS devices under repetitive stress conditions using transient thermal mapping and numerical simulation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#BychikhinHRVGP10}, volume = 50, year = 2010 }