%0 Conference Paper %1 conf/ats/WangSMK12 %A Wang, Senling %A Sato, Yasuo %A Miyase, Kohei %A Kajihara, Seiji %B Asian Test Symposium %D 2012 %I IEEE Computer Society %K dblp %P 272-277 %T A Scan-Out Power Reduction Method for Multi-cycle BIST. %U http://dblp.uni-trier.de/db/conf/ats/ats2012.html#WangSMK12 %@ 978-1-4673-4555-2

@inproceedings{conf/ats/WangSMK12, added-at = {2023-03-24T00:00:00.000+0100}, author = {Wang, Senling and Sato, Yasuo and Miyase, Kohei and Kajihara, Seiji}, biburl = {https://www.bibsonomy.org/bibtex/2606adef6b8d5a9e5ec21dc9329ef17e2/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2012}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2012.50}, interhash = {286c8a6d3531e34bd389b9eeaccca0de}, intrahash = {606adef6b8d5a9e5ec21dc9329ef17e2}, isbn = {978-1-4673-4555-2}, keywords = {dblp}, pages = {272-277}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:33.000+0200}, title = {A Scan-Out Power Reduction Method for Multi-cycle BIST.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2012.html#WangSMK12}, year = 2012 }