%0 Conference Paper %1 conf/eurodac/SienickiBAA95 %A Sienicki, James %A Bushnell, Michael L. %A Agrawal, Prathima %A Agrawal, Vishwani D. %B EURO-DAC %D 1995 %E Musgrave, Gerald %I IEEE Computer Society %K dblp %P 236-241 %T An adaptive distributed algorithm for sequential circuit test generation. %U http://dblp.uni-trier.de/db/conf/eurodac/euro-dac1995.html#SienickiBAA95 %@ 0-8186-7156-4

@inproceedings{conf/eurodac/SienickiBAA95, added-at = {2023-03-24T00:00:00.000+0100}, author = {Sienicki, James and Bushnell, Michael L. and Agrawal, Prathima and Agrawal, Vishwani D.}, biburl = {https://www.bibsonomy.org/bibtex/25ea84e53c3ce1960e865180b90073372/dblp}, booktitle = {EURO-DAC}, crossref = {conf/eurodac/1995}, editor = {Musgrave, Gerald}, ee = {http://dl.acm.org/citation.cfm?id=224325}, interhash = {261dd7aaba7814dd370d92ef3d09d961}, intrahash = {5ea84e53c3ce1960e865180b90073372}, isbn = {0-8186-7156-4}, keywords = {dblp}, pages = {236-241}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T15:05:25.000+0200}, title = {An adaptive distributed algorithm for sequential circuit test generation.}, url = {http://dblp.uni-trier.de/db/conf/eurodac/euro-dac1995.html#SienickiBAA95}, year = 1995 }