%0 Conference Paper %1 conf/iccad/WangDAC16 %A Wang, Ran %A Deutsch, Sergej %A Agrawal, Mukesh %A Chakrabarty, Krishnendu %B ICCAD %D 2016 %E Liu, Frank %I ACM %K %P 58 %T The hype, myths, and realities of testing 3D integrated circuits. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2016.html#WangDAC16 %@ 978-1-4503-4466-1

@inproceedings{conf/iccad/WangDAC16, added-at = {2023-12-12T19:48:33.000+0100}, author = {Wang, Ran and Deutsch, Sergej and Agrawal, Mukesh and Chakrabarty, Krishnendu}, biburl = {https://www.bibsonomy.org/bibtex/215fcb22babd2528b5f4fd3aa4ee6fd91/admin}, booktitle = {ICCAD}, crossref = {conf/iccad/2016}, editor = {Liu, Frank}, ee = {https://doi.org/10.1145/2966986.2980097}, interhash = {26578cfbc726db787b115b0acdfb764e}, intrahash = {15fcb22babd2528b5f4fd3aa4ee6fd91}, isbn = {978-1-4503-4466-1}, keywords = {}, pages = 58, publisher = {ACM}, timestamp = {2023-12-12T19:48:33.000+0100}, title = {The hype, myths, and realities of testing 3D integrated circuits.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2016.html#WangDAC16}, year = 2016 }