%0 Conference Paper %1 conf/itc/KimAS01 %A Kim, Yong Chang %A Agrawal, Vishwani D. %A Saluja, Kewal K. %B ITC %D 2001 %I IEEE Computer Society %K dblp %P 1078-1087 %T Combinational test generation for various classes of acyclic sequential circuits. %U http://dblp.uni-trier.de/db/conf/itc/itc2001.html#KimAS01 %@ 0-7803-7169-0

@inproceedings{conf/itc/KimAS01, added-at = {2023-03-23T00:00:00.000+0100}, author = {Kim, Yong Chang and Agrawal, Vishwani D. and Saluja, Kewal K.}, biburl = {https://www.bibsonomy.org/bibtex/26a7349bfda30f407e9b0e975ef8a165f/dblp}, booktitle = {ITC}, crossref = {conf/itc/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2001.966734}, interhash = {3df0086b4a5d518173bb89b854551a5d}, intrahash = {6a7349bfda30f407e9b0e975ef8a165f}, isbn = {0-7803-7169-0}, keywords = {dblp}, pages = {1078-1087}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:56.000+0200}, title = {Combinational test generation for various classes of acyclic sequential circuits.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2001.html#KimAS01}, year = 2001 }