%0 Journal Article %1 journals/tr/BalakrishnanCMP20 %A Balakrishnan, Narayanaswamy %A Castilla, Elena %A Martín, Nirian %A Pardo, Leandro %D 2020 %J IEEE Trans. Reliab. %K dblp %N 3 %P 937-953 %T Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model. %U http://dblp.uni-trier.de/db/journals/tr/tr69.html#BalakrishnanCMP20 %V 69

@article{journals/tr/BalakrishnanCMP20, added-at = {2020-09-19T00:00:00.000+0200}, author = {Balakrishnan, Narayanaswamy and Castilla, Elena and Martín, Nirian and Pardo, Leandro}, biburl = {https://www.bibsonomy.org/bibtex/2710e5cdd116fc6fc9251cc98549bc472/dblp}, ee = {https://doi.org/10.1109/TR.2019.2954385}, interhash = {a5ac82df478b30dc69a1ffa23d0b1267}, intrahash = {710e5cdd116fc6fc9251cc98549bc472}, journal = {IEEE Trans. Reliab.}, keywords = {dblp}, number = 3, pages = {937-953}, timestamp = {2020-09-20T11:35:05.000+0200}, title = {Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model.}, url = {http://dblp.uni-trier.de/db/journals/tr/tr69.html#BalakrishnanCMP20}, volume = 69, year = 2020 }