%0 Journal Article %1 journals/et/SoucarrosCCE13 %A Soucarros, Mathilde %A Clédière, Jessy %A Canovas-Dumas, Cécile %A Elbaz-Vincent, Philippe %D 2013 %J J. Electron. Test. %K dblp %N 3 %P 367-381 %T Fault Analysis and Evaluation of a True Random Number Generator Embedded in a Processor. %U http://dblp.uni-trier.de/db/journals/et/et29.html#SoucarrosCCE13 %V 29

@article{journals/et/SoucarrosCCE13, added-at = {2021-10-14T00:00:00.000+0200}, author = {Soucarros, Mathilde and Clédière, Jessy and Canovas-Dumas, Cécile and Elbaz-Vincent, Philippe}, biburl = {https://www.bibsonomy.org/bibtex/272fc6eb73bf4b9d31410388a1763f4aa/dblp}, ee = {https://doi.org/10.1007/s10836-013-5356-1}, interhash = {271ad01f6498789e600db5d88633b11e}, intrahash = {72fc6eb73bf4b9d31410388a1763f4aa}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 3, pages = {367-381}, timestamp = {2024-04-08T20:52:40.000+0200}, title = {Fault Analysis and Evaluation of a True Random Number Generator Embedded in a Processor.}, url = {http://dblp.uni-trier.de/db/journals/et/et29.html#SoucarrosCCE13}, volume = 29, year = 2013 }