%0 Conference Paper %1 conf/ieem/LaiHS15 %A Lai, Peng %A Hu, Weiwei %A Sun, Yufeng %B IEEM %D 2015 %I IEEE %K dblp %P 821-824 %T Anisotropic coupling damage model for reliability life assessment. %U http://dblp.uni-trier.de/db/conf/ieem/ieem2015.html#LaiHS15 %@ 978-1-4673-8066-9

@inproceedings{conf/ieem/LaiHS15, added-at = {2017-03-27T00:00:00.000+0200}, author = {Lai, Peng and Hu, Weiwei and Sun, Yufeng}, biburl = {https://www.bibsonomy.org/bibtex/2776884138b8bd0f0ccd4d2d1042d1450/dblp}, booktitle = {IEEM}, crossref = {conf/ieem/2015}, ee = {http://dx.doi.org/10.1109/IEEM.2015.7385762}, interhash = {eb190b5ad5b58c7f1a03b4ac3fad3912}, intrahash = {776884138b8bd0f0ccd4d2d1042d1450}, isbn = {978-1-4673-8066-9}, keywords = {dblp}, pages = {821-824}, publisher = {IEEE}, timestamp = {2017-03-28T11:35:49.000+0200}, title = {Anisotropic coupling damage model for reliability life assessment.}, url = {http://dblp.uni-trier.de/db/conf/ieem/ieem2015.html#LaiHS15}, year = 2015 }