%0 Journal Article %1 journals/mr/IraceBSLR05 %A Irace, Andrea %A Breglio, Giovanni %A Spirito, Paolo %A Letor, Romeo %A Russo, Sebastiano %D 2005 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1706-1710 %T Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#IraceBSLR05 %V 45

@article{journals/mr/IraceBSLR05, added-at = {2021-10-14T00:00:00.000+0200}, author = {Irace, Andrea and Breglio, Giovanni and Spirito, Paolo and Letor, Romeo and Russo, Sebastiano}, biburl = {https://www.bibsonomy.org/bibtex/28475f3d9b77de9c11a4c8068248d0bb6/dblp}, ee = {https://doi.org/10.1016/j.microrel.2005.07.087}, interhash = {8af5e6c4edb2e5ff0bcce074304632f9}, intrahash = {8475f3d9b77de9c11a4c8068248d0bb6}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1706-1710}, timestamp = {2024-04-09T02:49:44.000+0200}, title = {Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#IraceBSLR05}, volume = 45, year = 2005 }