%0 Conference Paper %1 conf/ats/BoseA95 %A Bose, Soumitra %A Agrawal, Vishwani D. %B Asian Test Symposium %D 1995 %I IEEE Computer Society %K dblp %P 353- %T Sequential logic path delay test generation by symbolic analysis. %U http://dblp.uni-trier.de/db/conf/ats/ats1995.html#BoseA95 %@ 0-8186-7129-7

@inproceedings{conf/ats/BoseA95, added-at = {2023-03-24T00:00:00.000+0100}, author = {Bose, Soumitra and Agrawal, Vishwani D.}, biburl = {https://www.bibsonomy.org/bibtex/28638b17af8a5bdf4997ca357218f01fc/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1995}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1995.485360}, interhash = {b8d31a70031dae3306bb5ea11583c347}, intrahash = {8638b17af8a5bdf4997ca357218f01fc}, isbn = {0-8186-7129-7}, keywords = {dblp}, pages = {353-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:35:47.000+0200}, title = {Sequential logic path delay test generation by symbolic analysis.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1995.html#BoseA95}, year = 1995 }