%0 Journal Article %1 journals/tr/IbrahimBB12 %A Ibrahim, Walid %A Beiu, Valeriu %A Beg, Azam %D 2012 %J IEEE Trans. Reliab. %K dblp %N 3 %P 675-686 %T Optimum Reliability Sizing for Complementary Metal Oxide Semiconductor Gates. %U http://dblp.uni-trier.de/db/journals/tr/tr61.html#IbrahimBB12 %V 61

@article{journals/tr/IbrahimBB12, added-at = {2021-04-09T00:00:00.000+0200}, author = {Ibrahim, Walid and Beiu, Valeriu and Beg, Azam}, biburl = {https://www.bibsonomy.org/bibtex/289bcabee58c7b5110c1c95bc71ee01e8/dblp}, ee = {https://doi.org/10.1109/TR.2012.2206249}, interhash = {ad4c653f346ff9bcbeb4e2a1dbbd1402}, intrahash = {89bcabee58c7b5110c1c95bc71ee01e8}, journal = {IEEE Trans. Reliab.}, keywords = {dblp}, number = 3, pages = {675-686}, timestamp = {2024-04-08T12:30:23.000+0200}, title = {Optimum Reliability Sizing for Complementary Metal Oxide Semiconductor Gates.}, url = {http://dblp.uni-trier.de/db/journals/tr/tr61.html#IbrahimBB12}, volume = 61, year = 2012 }