We analyzed low-background data from the CRESST-II experiment with a total net exposure of 730 kg days to extract limits on double electron capture processes. We established new limits for 40 Ca with ##IMG## http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn1.gif $T_1/2^22K9.910^21$ y and ##IMG## http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn2.gif $T_1/2^02EC1.410^22$ y and for 180 W with ##IMG## http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn3.gif $T_1/2^22K3.110^19$ y and ##IMG## http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn4.gif $T_1/2^02EC9.410^18$ y at 90% CL. Depending on the process, these values improve the currently best limits by a factor of ##IMG## http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn5.gif $1.4--30$ .
Beschreibung
New limits on double electron capture of 40Ca and 180W - IOPscience
%0 Journal Article
%1 2016CRESST_DoubleEC
%A Angloher, G
%A Bauer, M
%A Bauer, P
%A Bavykina, I
%A Bento, A
%A Bucci, C
%A Canonica, L
%A Ciemniak, C
%A Defay, X
%A Deuter, G
%A Erb, A
%A v Feilitzsch, F
%A Iachellini, N Ferreiro
%A Gorla, P
%A Gütlein, A
%A Hauff, D
%A Huff, P
%A Isaila, C
%A Jochum, J
%A Kiefer, M
%A Kimmerle, M
%A Kluck, H
%A Kraus, H
%A Lanfranchi, J-C
%A Loebell, J
%A Münster, A
%A Pagliarone, C
%A Petricca, F
%A Pfister, S
%A Potzel, W
%A Pröbst, F
%A Reindl, F
%A Roth, S
%A Rottler, K
%A Sailer, C
%A Schäffner, K
%A Schieck, J
%A Schmaler, J
%A Scholl, S
%A Schönert, S
%A Seidel, W
%A v Sivers, M
%A Stodolsky, L
%A Strandhagen, C
%A Strauss, R
%A Tanzke, A
%A Tretyak, V
%A Thi, H H Trinh
%A Türkoǧlu, C
%A Uffinger, M
%A Ulrich, A
%A Usherov, I
%A Wawoczny, S
%A Willers, M
%A Wüstrich, M
%A Zöller, A
%D 2016
%J Journal of Physics G: Nuclear and Particle Physics
%K cresst ec myown
%N 9
%P 095202
%T New limits on double electron capture of 40 Ca and 180 W
%U http://stacks.iop.org/0954-3899/43/i=9/a=095202
%V 43
%X We analyzed low-background data from the CRESST-II experiment with a total net exposure of 730 kg days to extract limits on double electron capture processes. We established new limits for 40 Ca with ##IMG## http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn1.gif $T_1/2^22K9.910^21$ y and ##IMG## http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn2.gif $T_1/2^02EC1.410^22$ y and for 180 W with ##IMG## http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn3.gif $T_1/2^22K3.110^19$ y and ##IMG## http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn4.gif $T_1/2^02EC9.410^18$ y at 90% CL. Depending on the process, these values improve the currently best limits by a factor of ##IMG## http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn5.gif $1.4--30$ .
@article{2016CRESST_DoubleEC,
abstract = {We analyzed low-background data from the CRESST-II experiment with a total net exposure of 730 kg days to extract limits on double electron capture processes. We established new limits for 40 Ca with ##IMG## [http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn1.gif] {${T}_{1/2}^{2\nu 2{\rm{K}}}\gt 9.9\times {10}^{21}$} y and ##IMG## [http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn2.gif] {${T}_{1/2}^{0\nu 2\mathrm{EC}}\gt 1.4\times {10}^{22}$} y and for 180 W with ##IMG## [http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn3.gif] {${T}_{1/2}^{2\nu 2{\rm{K}}}\gt 3.1\times {10}^{19}$} y and ##IMG## [http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn4.gif] {${T}_{1/2}^{0\nu 2\mathrm{EC}}\gt 9.4\times {10}^{18}$} y at 90% CL. Depending on the process, these values improve the currently best limits by a factor of ##IMG## [http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn5.gif] {$\sim 1.4\mbox{--}30$} .},
added-at = {2017-01-20T14:35:00.000+0100},
author = {Angloher, G and Bauer, M and Bauer, P and Bavykina, I and Bento, A and Bucci, C and Canonica, L and Ciemniak, C and Defay, X and Deuter, G and Erb, A and v Feilitzsch, F and Iachellini, N Ferreiro and Gorla, P and Gütlein, A and Hauff, D and Huff, P and Isaila, C and Jochum, J and Kiefer, M and Kimmerle, M and Kluck, H and Kraus, H and Lanfranchi, J-C and Loebell, J and Münster, A and Pagliarone, C and Petricca, F and Pfister, S and Potzel, W and Pröbst, F and Reindl, F and Roth, S and Rottler, K and Sailer, C and Schäffner, K and Schieck, J and Schmaler, J and Scholl, S and Schönert, S and Seidel, W and v Sivers, M and Stodolsky, L and Strandhagen, C and Strauss, R and Tanzke, A and Tretyak, V and Thi, H H Trinh and Türkoǧlu, C and Uffinger, M and Ulrich, A and Usherov, I and Wawoczny, S and Willers, M and Wüstrich, M and Zöller, A},
biburl = {https://www.bibsonomy.org/bibtex/28a0113e5e3ffe3b5e9192ee76901dc1b/strandhagen},
description = {New limits on double electron capture of 40Ca and 180W - IOPscience},
interhash = {dca12012774d3c052138d387120f0728},
intrahash = {8a0113e5e3ffe3b5e9192ee76901dc1b},
journal = {Journal of Physics G: Nuclear and Particle Physics},
keywords = {cresst ec myown},
number = 9,
pages = 095202,
timestamp = {2017-01-20T14:35:00.000+0100},
title = {New limits on double electron capture of 40 Ca and 180 W},
url = {http://stacks.iop.org/0954-3899/43/i=9/a=095202},
volume = 43,
year = 2016
}