%0 Conference Paper %1 conf/isqed/MatsuokaIHT10 %A Matsuoka, Hidetoshi %A Ikeda, Hiroshi %A Higuchi, Hiroyuki %A Tomita, Yoshinori %B ISQED %D 2010 %I IEEE %K dblp %P 22-28 %T An accurate modeling method utilizing application-specific statistical information and its application to SRAM yield estimation. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2010.html#MatsuokaIHT10 %@ 978-1-4244-6455-5

@inproceedings{conf/isqed/MatsuokaIHT10, added-at = {2017-05-25T00:00:00.000+0200}, author = {Matsuoka, Hidetoshi and Ikeda, Hiroshi and Higuchi, Hiroyuki and Tomita, Yoshinori}, biburl = {https://www.bibsonomy.org/bibtex/28bfd3bacb95295d13f5a2c50a9a8944d/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2010}, ee = {https://doi.org/10.1109/ISQED.2010.5450411}, interhash = {857b4d234cd623854a5e3f37d167cc84}, intrahash = {8bfd3bacb95295d13f5a2c50a9a8944d}, isbn = {978-1-4244-6455-5}, keywords = {dblp}, pages = {22-28}, publisher = {IEEE}, timestamp = {2017-05-26T13:02:26.000+0200}, title = {An accurate modeling method utilizing application-specific statistical information and its application to SRAM yield estimation.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2010.html#MatsuokaIHT10}, year = 2010 }