%0 Conference Paper %1 conf/isvlsi/AgboTHWCRCD16 %A Agbo, Innocent %A Taouil, Mottaqiallah %A Hamdioui, Said %A Weckx, Pieter %A Cosemans, Stefan %A Raghavan, Praveen %A Catthoor, Francky %A Dehaene, Wim %B ISVLSI %D 2016 %I IEEE Computer Society %K dblp %P 725-730 %T Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability. %U http://dblp.uni-trier.de/db/conf/isvlsi/isvlsi2016.html#AgboTHWCRCD16 %@ 978-1-4673-9039-2

@inproceedings{conf/isvlsi/AgboTHWCRCD16, added-at = {2023-03-24T00:00:00.000+0100}, author = {Agbo, Innocent and Taouil, Mottaqiallah and Hamdioui, Said and Weckx, Pieter and Cosemans, Stefan and Raghavan, Praveen and Catthoor, Francky and Dehaene, Wim}, biburl = {https://www.bibsonomy.org/bibtex/28d56317e608df52c67cfb7804747d694/dblp}, booktitle = {ISVLSI}, crossref = {conf/isvlsi/2016}, ee = {https://doi.ieeecomputersociety.org/10.1109/ISVLSI.2016.30}, interhash = {4dfb0398ba0f1dcccfa814927c8bb366}, intrahash = {8d56317e608df52c67cfb7804747d694}, isbn = {978-1-4673-9039-2}, keywords = {dblp}, pages = {725-730}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T11:08:57.000+0200}, title = {Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability.}, url = {http://dblp.uni-trier.de/db/conf/isvlsi/isvlsi2016.html#AgboTHWCRCD16}, year = 2016 }