%0 Conference Paper %1 conf/ats/KhusyariNJANAO08 %A Khusyari, Khairul %A Ng, Wei Tee %A Jaarsma, Neal %A Abraham, Robert %A Ng, Peng Weng %A Ang, Boon Hui %A Ong, Chin Hu %B ATS %D 2008 %I IEEE Computer Society %K dblp %P 271 %T Diagnosis of Voltage Dependent Scan Chain Failure Using VBUMP Scan Debug Method. %U http://dblp.uni-trier.de/db/conf/ats/ats2008.html#KhusyariNJANAO08 %@ 978-0-7695-3396-4

@inproceedings{conf/ats/KhusyariNJANAO08, added-at = {2023-03-24T00:00:00.000+0100}, author = {Khusyari, Khairul and Ng, Wei Tee and Jaarsma, Neal and Abraham, Robert and Ng, Peng Weng and Ang, Boon Hui and Ong, Chin Hu}, biburl = {https://www.bibsonomy.org/bibtex/296c24d0249f383f686f2f43763bc3b2c/dblp}, booktitle = {ATS}, crossref = {conf/ats/2008}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2008.66}, interhash = {42ad4594dacf7ec53fc75a5f07ac7543}, intrahash = {96c24d0249f383f686f2f43763bc3b2c}, isbn = {978-0-7695-3396-4}, keywords = {dblp}, pages = 271, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:37:03.000+0200}, title = {Diagnosis of Voltage Dependent Scan Chain Failure Using VBUMP Scan Debug Method.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2008.html#KhusyariNJANAO08}, year = 2008 }