%0 Conference Paper %1 conf/itc/GyvezGA03 %A de Gyvez, José Pineda %A Gronthoud, Guido %A Amine, Rashid %B ITC %D 2003 %I IEEE Computer Society %K dblp %P 651-658 %T VDD Ramp Testing for RF Circuits. %U http://dblp.uni-trier.de/db/conf/itc/itc2003.html#GyvezGA03 %@ 0-7803-8106-8

@inproceedings{conf/itc/GyvezGA03, added-at = {2023-03-23T00:00:00.000+0100}, author = {de Gyvez, José Pineda and Gronthoud, Guido and Amine, Rashid}, biburl = {https://www.bibsonomy.org/bibtex/2d455d63dc5670f7038417e7365901e66/dblp}, booktitle = {ITC}, crossref = {conf/itc/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270893}, interhash = {29942477ced13f20610cbd10f795d9d2}, intrahash = {d455d63dc5670f7038417e7365901e66}, isbn = {0-7803-8106-8}, keywords = {dblp}, pages = {651-658}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:31.000+0200}, title = {VDD Ramp Testing for RF Circuits.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2003.html#GyvezGA03}, year = 2003 }