%0 Conference Paper %1 conf/itc/ArabiIDK98 %A Arabi, Karim %A Ihs, Hassan %A Dufaza, Christian %A Kaminska, Bozena %B ITC %D 1998 %I IEEE Computer Society %K dblp %P 91-100 %T Digital oscillation-test method for delay and stuck-at fault testing of digital circuits. %U http://dblp.uni-trier.de/db/conf/itc/itc1998.html#ArabiIDK98 %@ 0-7803-5093-6

@inproceedings{conf/itc/ArabiIDK98, added-at = {2023-03-23T00:00:00.000+0100}, author = {Arabi, Karim and Ihs, Hassan and Dufaza, Christian and Kaminska, Bozena}, biburl = {https://www.bibsonomy.org/bibtex/29baa440b185abba7e8368c259fbde48f/dblp}, booktitle = {ITC}, crossref = {conf/itc/1998}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1998.743141}, interhash = {23e19950283d68c4602f7e9790c7d305}, intrahash = {9baa440b185abba7e8368c259fbde48f}, isbn = {0-7803-5093-6}, keywords = {dblp}, pages = {91-100}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:01.000+0200}, title = {Digital oscillation-test method for delay and stuck-at fault testing of digital circuits.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1998.html#ArabiIDK98}, year = 1998 }