%0 Conference Paper %1 conf/ic3k/KoutroulisSWFKT20 %A Koutroulis, Georgios %A Santos, Tiago %A Wiedemann, Michael %A Faistauer, Christian %A Kern, Roman %A Thalmann, Stefan %B KDIR %D 2020 %E Fred, Ana L. N. %E Filipe, Joaquim %I SCITEPRESS %K dblp %P 269-276 %T Enhanced Active Learning of Convolutional Neural Networks: A Case Study for Defect Classification in the Semiconductor Industry. %U http://dblp.uni-trier.de/db/conf/ic3k/kdir2020.html#KoutroulisSWFKT20 %@ 978-989-758-474-9

@inproceedings{conf/ic3k/KoutroulisSWFKT20, added-at = {2021-04-09T00:00:00.000+0200}, author = {Koutroulis, Georgios and Santos, Tiago and Wiedemann, Michael and Faistauer, Christian and Kern, Roman and Thalmann, Stefan}, biburl = {https://www.bibsonomy.org/bibtex/29f2cf0cbd9226cc82452556348ee197f/dblp}, booktitle = {KDIR}, crossref = {conf/ic3k/2020kdir}, editor = {Fred, Ana L. N. and Filipe, Joaquim}, ee = {https://doi.org/10.5220/0010142902690276}, interhash = {167cd853b84b91bf7ddf448499571a3a}, intrahash = {9f2cf0cbd9226cc82452556348ee197f}, isbn = {978-989-758-474-9}, keywords = {dblp}, pages = {269-276}, publisher = {SCITEPRESS}, timestamp = {2024-04-09T23:25:29.000+0200}, title = {Enhanced Active Learning of Convolutional Neural Networks: A Case Study for Defect Classification in the Semiconductor Industry.}, url = {http://dblp.uni-trier.de/db/conf/ic3k/kdir2020.html#KoutroulisSWFKT20}, year = 2020 }