%0 Journal Article %1 journals/jssc/YamaokaSMSKSYO05 %A Yamaoka, Masanao %A Shinozaki, Yoshihiro %A Maeda, Noriaki %A Shimazaki, Yasuhisa %A Kato, Kei %A Shimada, Shigeru %A Yanagisawa, Kazumasa %A Osada, Kenichi %D 2005 %J IEEE J. Solid State Circuits %K dblp %N 1 %P 186-194 %T A 300-MHz 25-μA/Mb-leakage on-chip SRAM module featuring process-variation immunity and low-leakage-active mode for mobile-phone application processor. %U http://dblp.uni-trier.de/db/journals/jssc/jssc40.html#YamaokaSMSKSYO05 %V 40

@article{journals/jssc/YamaokaSMSKSYO05, added-at = {2022-03-14T00:00:00.000+0100}, author = {Yamaoka, Masanao and Shinozaki, Yoshihiro and Maeda, Noriaki and Shimazaki, Yasuhisa and Kato, Kei and Shimada, Shigeru and Yanagisawa, Kazumasa and Osada, Kenichi}, biburl = {https://www.bibsonomy.org/bibtex/29ff17b6548db4611e95c205e25473b6f/dblp}, ee = {https://doi.org/10.1109/JSSC.2004.838014}, interhash = {f4e97683b979f9b918a93b8215b67ebc}, intrahash = {9ff17b6548db4611e95c205e25473b6f}, journal = {IEEE J. Solid State Circuits}, keywords = {dblp}, number = 1, pages = {186-194}, timestamp = {2024-04-08T10:43:46.000+0200}, title = {A 300-MHz 25-μA/Mb-leakage on-chip SRAM module featuring process-variation immunity and low-leakage-active mode for mobile-phone application processor.}, url = {http://dblp.uni-trier.de/db/journals/jssc/jssc40.html#YamaokaSMSKSYO05}, volume = 40, year = 2005 }