%0 Conference Paper %1 conf/ats/HuangHLHLL11 %A Huang, Keheng %A Hu, Yu %A Li, Xiaowei %A Hua, Gengxin %A Liu, Hongjin %A Liu, Bo %B Asian Test Symposium %D 2011 %I IEEE Computer Society %K dblp %P 438-443 %T Exploiting Free LUT Entries to Mitigate Soft Errors in SRAM-based FPGAs. %U http://dblp.uni-trier.de/db/conf/ats/ats2011.html#HuangHLHLL11 %@ 978-1-4577-1984-4

@inproceedings{conf/ats/HuangHLHLL11, added-at = {2023-03-24T00:00:00.000+0100}, author = {Huang, Keheng and Hu, Yu and Li, Xiaowei and Hua, Gengxin and Liu, Hongjin and Liu, Bo}, biburl = {https://www.bibsonomy.org/bibtex/2a36790d220b566258b418c6606375846/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2011}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2011.25}, interhash = {a0a3b7a24647b8366b6cb4ecd7535fa2}, intrahash = {a36790d220b566258b418c6606375846}, isbn = {978-1-4577-1984-4}, keywords = {dblp}, pages = {438-443}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:27.000+0200}, title = {Exploiting Free LUT Entries to Mitigate Soft Errors in SRAM-based FPGAs.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2011.html#HuangHLHLL11}, year = 2011 }