%0 Conference Paper %1 conf/ats/LiQLZ12 %A Li, Guoliang %A Qian, Jun %A Li, Peter %A Zuo, Greg %B Asian Test Symposium %D 2012 %I IEEE Computer Society %K dblp %P 77-82 %T Multi-level EDT to Reduce Scan Channels in SoC Designs. %U http://dblp.uni-trier.de/db/conf/ats/ats2012.html#LiQLZ12 %@ 978-1-4673-4555-2

@inproceedings{conf/ats/LiQLZ12, added-at = {2023-03-24T00:00:00.000+0100}, author = {Li, Guoliang and Qian, Jun and Li, Peter and Zuo, Greg}, biburl = {https://www.bibsonomy.org/bibtex/28ed9fffdbe84fc97073539f5c5e4c31b/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2012}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2012.70}, interhash = {2a4131aa2c602ef895101fb7fdc35915}, intrahash = {8ed9fffdbe84fc97073539f5c5e4c31b}, isbn = {978-1-4673-4555-2}, keywords = {dblp}, pages = {77-82}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:33.000+0200}, title = {Multi-level EDT to Reduce Scan Channels in SoC Designs.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2012.html#LiQLZ12}, year = 2012 }