%0 Conference Paper %1 conf/dac/KajiharaPKR93 %A Kajihara, Seiji %A Pomeranz, Irith %A Kinoshita, Kozo %A Reddy, Sudhakar M. %B DAC %D 1993 %E Dunlop, Alfred E. %I ACM Press %K dblp %P 102-106 %T Cost-Effective Generation of Minimal Test Sets for Stuck-at Faults in Combinational Logic Circuits. %U http://dblp.uni-trier.de/db/conf/dac/dac93.html#KajiharaPKR93 %@ 0-89791-577-1

@inproceedings{conf/dac/KajiharaPKR93, added-at = {2017-03-16T00:00:00.000+0100}, author = {Kajihara, Seiji and Pomeranz, Irith and Kinoshita, Kozo and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/2a6ec7f564c57e814349a95c6a5103a49/dblp}, booktitle = {DAC}, crossref = {conf/dac/1993}, editor = {Dunlop, Alfred E.}, ee = {http://doi.acm.org/10.1145/157485.164617}, interhash = {63ee5faa0e0059545488bfcd0cce0e0e}, intrahash = {a6ec7f564c57e814349a95c6a5103a49}, isbn = {0-89791-577-1}, keywords = {dblp}, pages = {102-106}, publisher = {ACM Press}, timestamp = {2017-03-17T11:41:30.000+0100}, title = {Cost-Effective Generation of Minimal Test Sets for Stuck-at Faults in Combinational Logic Circuits.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac93.html#KajiharaPKR93}, year = 1993 }