%0 Conference Paper %1 conf/dsd/EbrahimiK16 %A Ebrahimi, Hassan %A Kerkhoff, Hans G. %B DSD %D 2016 %E Kitsos, Paris %I IEEE Computer Society %K dblp %P 703-707 %T Testing for Intermittent Resistive Faults in CMOS Integrated Systems. %U http://dblp.uni-trier.de/db/conf/dsd/dsd2016.html#EbrahimiK16 %@ 978-1-5090-2817-7

@inproceedings{conf/dsd/EbrahimiK16, added-at = {2023-03-23T00:00:00.000+0100}, author = {Ebrahimi, Hassan and Kerkhoff, Hans G.}, biburl = {https://www.bibsonomy.org/bibtex/2a8e5df633e7a4f7cc73e1f40d0b0b03d/dblp}, booktitle = {DSD}, crossref = {conf/dsd/2016}, editor = {Kitsos, Paris}, ee = {https://doi.ieeecomputersociety.org/10.1109/DSD.2016.58}, interhash = {cbf542136365bdf67b77574a6084046e}, intrahash = {a8e5df633e7a4f7cc73e1f40d0b0b03d}, isbn = {978-1-5090-2817-7}, keywords = {dblp}, pages = {703-707}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T14:11:20.000+0200}, title = {Testing for Intermittent Resistive Faults in CMOS Integrated Systems.}, url = {http://dblp.uni-trier.de/db/conf/dsd/dsd2016.html#EbrahimiK16}, year = 2016 }