%0 Conference Paper %1 conf/itc/DebB00 %A Deb, Nilmoni %A Blanton, Ronald D. %B ITC %D 2000 %I IEEE Computer Society %K dblp %P 739-749 %T Analysis of failure sources in surface-micromachined MEMS. %U http://dblp.uni-trier.de/db/conf/itc/itc2000.html#DebB00 %@ 0-7803-6546-1

@inproceedings{conf/itc/DebB00, added-at = {2023-03-23T00:00:00.000+0100}, author = {Deb, Nilmoni and Blanton, Ronald D.}, biburl = {https://www.bibsonomy.org/bibtex/2aa7673f2d54bf8f5536eafac5c3aafd9/dblp}, booktitle = {ITC}, crossref = {conf/itc/2000}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2000.894270}, interhash = {644292c28e4cb4096c4789d7e909481d}, intrahash = {aa7673f2d54bf8f5536eafac5c3aafd9}, isbn = {0-7803-6546-1}, keywords = {dblp}, pages = {739-749}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:46.000+0200}, title = {Analysis of failure sources in surface-micromachined MEMS.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2000.html#DebB00}, year = 2000 }