%0 Conference Paper %1 conf/itc/LangPM00 %A Lang, Helmut %A Pfeiffer, Jens %A Maguire, Jeff %B ITC %D 2000 %I IEEE Computer Society %K dblp %P 638-643 %T Using on-chip test pattern compression for full scan SoC designs. %U http://dblp.uni-trier.de/db/conf/itc/itc2000.html#LangPM00 %@ 0-7803-6546-1

@inproceedings{conf/itc/LangPM00, added-at = {2023-03-23T00:00:00.000+0100}, author = {Lang, Helmut and Pfeiffer, Jens and Maguire, Jeff}, biburl = {https://www.bibsonomy.org/bibtex/2abb5f5ec69a74d5987a5cb02bcc55866/dblp}, booktitle = {ITC}, crossref = {conf/itc/2000}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2000.894258}, interhash = {90ee3b0ca7b776b93dbe0fb6d7d45216}, intrahash = {abb5f5ec69a74d5987a5cb02bcc55866}, isbn = {0-7803-6546-1}, keywords = {dblp}, pages = {638-643}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:46.000+0200}, title = {Using on-chip test pattern compression for full scan SoC designs.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2000.html#LangPM00}, year = 2000 }