Data on optical reflectance and anodization voltage, obtained during the
galvanostatic anodization of metallic niobium foils in an H3PO4(1%)
solution at room temperature were simultaneously recorded as a function
of time, to determine the thickness of the Nb2O5 films formed. From
these data, plots of film thickness vs anodization voltage were
obtained. A linear relation was always observed and in all cases but
one, an angular coefficient of 22 angstrom V-1 was verified.
%0 Journal Article
%1 WOS:A1991FX08000007
%A JULIAO, JF
%A CHAGAS, JWR
%A CESAR, HL
%A DIAS, NL
%A DECKER, F
%A GOMES, UU
%C THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND OX5 1GB
%D 1991
%I PERGAMON-ELSEVIER SCIENCE LTD
%J ELECTROCHIMICA ACTA
%K INTERFACE INTERFERENCE; INTERFEROMETRY; OXIDE} {ANODIZATION;
%N 8
%P 1297-1300
%R 10.1016/0013-4686(91)80008-V
%T ANODIC NIOBIUM PENTOXIDE FILMS - GROWTH AND THICKNESS DETERMINATION BY
INSITU OPTOELECTROCHEMICAL MEASUREMENTS
%V 36
%X Data on optical reflectance and anodization voltage, obtained during the
galvanostatic anodization of metallic niobium foils in an H3PO4(1%)
solution at room temperature were simultaneously recorded as a function
of time, to determine the thickness of the Nb2O5 films formed. From
these data, plots of film thickness vs anodization voltage were
obtained. A linear relation was always observed and in all cases but
one, an angular coefficient of 22 angstrom V-1 was verified.
@article{WOS:A1991FX08000007,
abstract = {Data on optical reflectance and anodization voltage, obtained during the
galvanostatic anodization of metallic niobium foils in an H3PO4(1%)
solution at room temperature were simultaneously recorded as a function
of time, to determine the thickness of the Nb2O5 films formed. From
these data, plots of film thickness vs anodization voltage were
obtained. A linear relation was always observed and in all cases but
one, an angular coefficient of 22 angstrom V-1 was verified.},
added-at = {2022-05-23T20:00:14.000+0200},
address = {THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND OX5 1GB},
author = {JULIAO, JF and CHAGAS, JWR and CESAR, HL and DIAS, NL and DECKER, F and GOMES, UU},
biburl = {https://www.bibsonomy.org/bibtex/2ace7e3b49dc716a3e750fe4c22dfe2f9/ppgfis_ufc_br},
doi = {10.1016/0013-4686(91)80008-V},
interhash = {0525591863a65fbc4ad9b6c9adc0248c},
intrahash = {ace7e3b49dc716a3e750fe4c22dfe2f9},
issn = {0013-4686},
journal = {ELECTROCHIMICA ACTA},
keywords = {INTERFACE INTERFERENCE; INTERFEROMETRY; OXIDE} {ANODIZATION;},
number = 8,
pages = {1297-1300},
publisher = {PERGAMON-ELSEVIER SCIENCE LTD},
pubstate = {published},
timestamp = {2022-05-23T20:00:14.000+0200},
title = {ANODIC NIOBIUM PENTOXIDE FILMS - GROWTH AND THICKNESS DETERMINATION BY
INSITU OPTOELECTROCHEMICAL MEASUREMENTS},
tppubtype = {article},
volume = 36,
year = 1991
}