%0 Conference Paper %1 conf/isvlsi/VermaHPB16 %A Verma, Pankaj %A Halba, Rohit %A Patel, Hemant %A Baghini, Maryam Shojaei %B ISVLSI %D 2016 %I IEEE Computer Society %K dblp %P 331-336 %T On-Chip Delay Measurement Circuit for Reliability Characterization of SRAM. %U http://dblp.uni-trier.de/db/conf/isvlsi/isvlsi2016.html#VermaHPB16 %@ 978-1-4673-9039-2

@inproceedings{conf/isvlsi/VermaHPB16, added-at = {2023-03-24T00:00:00.000+0100}, author = {Verma, Pankaj and Halba, Rohit and Patel, Hemant and Baghini, Maryam Shojaei}, biburl = {https://www.bibsonomy.org/bibtex/2b01ae99649caff075152ebd4b30d4587/dblp}, booktitle = {ISVLSI}, crossref = {conf/isvlsi/2016}, ee = {https://doi.ieeecomputersociety.org/10.1109/ISVLSI.2016.24}, interhash = {51c2330d615f854a05209fbb35ba7d2b}, intrahash = {b01ae99649caff075152ebd4b30d4587}, isbn = {978-1-4673-9039-2}, keywords = {dblp}, pages = {331-336}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T11:08:57.000+0200}, title = {On-Chip Delay Measurement Circuit for Reliability Characterization of SRAM.}, url = {http://dblp.uni-trier.de/db/conf/isvlsi/isvlsi2016.html#VermaHPB16}, year = 2016 }