%0 Journal Article %1 journals/mr/DetzelGW04 %A Detzel, Thomas %A Glavanovics, Michael %A Weber, Karin %D 2004 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1485-1490 %T Analysis of wire bond and metallization degradation mechanisms in DMOS power transistors stressed under thermal overload conditions. %U http://dblp.uni-trier.de/db/journals/mr/mr44.html#DetzelGW04 %V 44

@article{journals/mr/DetzelGW04, added-at = {2020-02-22T00:00:00.000+0100}, author = {Detzel, Thomas and Glavanovics, Michael and Weber, Karin}, biburl = {https://www.bibsonomy.org/bibtex/2b749f97de826f2662e936c91f0bcd81b/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.07.044}, interhash = {8463fe59781c143b97ca986ba1b54071}, intrahash = {b749f97de826f2662e936c91f0bcd81b}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1485-1490}, timestamp = {2020-02-25T13:22:27.000+0100}, title = {Analysis of wire bond and metallization degradation mechanisms in DMOS power transistors stressed under thermal overload conditions.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#DetzelGW04}, volume = 44, year = 2004 }