%0 Journal Article %1 journals/mj/VoutilainenPMJ09 %A Voutilainen, Juha-Veikko %A Putaala, Jussi %A Moilanen, Markku %A Jantunen, Heli %D 2009 %J Microelectron. J. %K dblp %N 7 %P 1069-1080 %T A prognostic method for the embedded failure monitoring of solder interconnections with 1149.4 test bus architecture. %U http://dblp.uni-trier.de/db/journals/mj/mj40.html#VoutilainenPMJ09 %V 40

@article{journals/mj/VoutilainenPMJ09, added-at = {2020-02-22T00:00:00.000+0100}, author = {Voutilainen, Juha-Veikko and Putaala, Jussi and Moilanen, Markku and Jantunen, Heli}, biburl = {https://www.bibsonomy.org/bibtex/2b88903b47a74882a4185ce74b63ebf77/dblp}, ee = {https://doi.org/10.1016/j.mejo.2007.09.009}, interhash = {45e22a7c712c25ef28d1f569aa13cedf}, intrahash = {b88903b47a74882a4185ce74b63ebf77}, journal = {Microelectron. J.}, keywords = {dblp}, number = 7, pages = {1069-1080}, timestamp = {2020-02-25T13:01:07.000+0100}, title = {A prognostic method for the embedded failure monitoring of solder interconnections with 1149.4 test bus architecture.}, url = {http://dblp.uni-trier.de/db/journals/mj/mj40.html#VoutilainenPMJ09}, volume = 40, year = 2009 }