%0 Journal Article %1 journals/jssc/MukhopadhyayKM007 %A Mukhopadhyay, Saibal %A Kim, Keejong %A Mahmoodi, Hamid %A Roy, Kaushik %D 2007 %J IEEE J. Solid State Circuits %K dblp %N 6 %P 1370-1382 %T Design of a Process Variation Tolerant Self-Repairing SRAM for Yield Enhancement in Nanoscaled CMOS. %U http://dblp.uni-trier.de/db/journals/jssc/jssc42.html#MukhopadhyayKM007 %V 42

@article{journals/jssc/MukhopadhyayKM007, added-at = {2020-10-26T00:00:00.000+0100}, author = {Mukhopadhyay, Saibal and Kim, Keejong and Mahmoodi, Hamid and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/2c152b6a41e923b0c78f58eaa8f2b708f/dblp}, ee = {https://doi.org/10.1109/JSSC.2007.897161}, interhash = {4f60709e8b77f845d3d6be30c5888650}, intrahash = {c152b6a41e923b0c78f58eaa8f2b708f}, journal = {IEEE J. Solid State Circuits}, keywords = {dblp}, number = 6, pages = {1370-1382}, timestamp = {2020-10-27T11:40:02.000+0100}, title = {Design of a Process Variation Tolerant Self-Repairing SRAM for Yield Enhancement in Nanoscaled CMOS.}, url = {http://dblp.uni-trier.de/db/journals/jssc/jssc42.html#MukhopadhyayKM007}, volume = 42, year = 2007 }