%0 Conference Paper %1 conf/vlsid/AgrawalAS92 %A Agrawal, Prathima %A Agrawal, Vishwani D. %A Seth, Sharad C. %B VLSI Design %D 1992 %I IEEE Computer Society %K dblp %P 4-11 %T A New Method for Generating Tests for Delay Faults in Non-Scan Circuits. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid1992.html#AgrawalAS92 %@ 0-8186-2465-5

@inproceedings{conf/vlsid/AgrawalAS92, added-at = {2023-03-24T00:00:00.000+0100}, author = {Agrawal, Prathima and Agrawal, Vishwani D. and Seth, Sharad C.}, biburl = {https://www.bibsonomy.org/bibtex/2c3222201de9d651e2ff0ac595ce40889/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/1992}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICVD.1992.658013}, interhash = {a6b87e23304952f11a94ca57125b544d}, intrahash = {c3222201de9d651e2ff0ac595ce40889}, isbn = {0-8186-2465-5}, keywords = {dblp}, pages = {4-11}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T05:47:09.000+0200}, title = {A New Method for Generating Tests for Delay Faults in Non-Scan Circuits.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid1992.html#AgrawalAS92}, year = 1992 }