%0 Journal Article %1 journals/todaes/PomeranzR09 %A Pomeranz, Irith %A Reddy, Sudhakar M. %D 2009 %J ACM Trans. Design Autom. Electr. Syst. %K dblp %N 1 %P 7:1-7:22 %T Using stuck-at tests to form scan-based tests for transition faults in standard-scan circuits. %U http://dblp.uni-trier.de/db/journals/todaes/todaes15.html#PomeranzR09 %V 15

@article{journals/todaes/PomeranzR09, added-at = {2018-11-06T00:00:00.000+0100}, author = {Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/2c56d6617dbb287f895044e4aa84a17ee/dblp}, ee = {https://doi.org/10.1145/1640457.1640464}, interhash = {cf2da7784f829373ae4e7281bfa4bfb2}, intrahash = {c56d6617dbb287f895044e4aa84a17ee}, journal = {ACM Trans. Design Autom. Electr. Syst.}, keywords = {dblp}, number = 1, pages = {7:1-7:22}, timestamp = {2018-11-07T12:24:24.000+0100}, title = {Using stuck-at tests to form scan-based tests for transition faults in standard-scan circuits.}, url = {http://dblp.uni-trier.de/db/journals/todaes/todaes15.html#PomeranzR09}, volume = 15, year = 2009 }