%0 Conference Paper %1 conf/iccd/PomeranzR01a %A Pomeranz, Irith %A Reddy, Sudhakar M. %B ICCD %D 2001 %I IEEE Computer Society %K dblp %P 148-153 %T A Partitioning and Storage Based Built-in Test Pattern Generation Method for Synchronous Sequential Circuits. %U http://dblp.uni-trier.de/db/conf/iccd/iccd2001.html#PomeranzR01a %@ 0-7695-1200-3

@inproceedings{conf/iccd/PomeranzR01a, added-at = {2023-03-23T00:00:00.000+0100}, author = {Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/2c606d34cbf0ddce6bf85b9f24091f7c9/dblp}, booktitle = {ICCD}, crossref = {conf/iccd/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICCD.2001.955017}, interhash = {435cb90387fa6139536a86f31c6a6ae2}, intrahash = {c606d34cbf0ddce6bf85b9f24091f7c9}, isbn = {0-7695-1200-3}, keywords = {dblp}, pages = {148-153}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:23:03.000+0200}, title = {A Partitioning and Storage Based Built-in Test Pattern Generation Method for Synchronous Sequential Circuits.}, url = {http://dblp.uni-trier.de/db/conf/iccd/iccd2001.html#PomeranzR01a}, year = 2001 }