%0 Journal Article %1 journals/ieiceee/AlnajjarMHO13 %A Alnajiar, Dawood %A Mitsuyama, Yukio %A Hashimoto, Masanori %A Onoye, Takao %D 2013 %J IEICE Electron. Express %K dblp %N 5 %P 20130081 %T PVT-induced timing error detection through replica circuits and time redundancy in reconfigurable devices. %U http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee10.html#AlnajjarMHO13 %V 10

@article{journals/ieiceee/AlnajjarMHO13, added-at = {2022-01-03T00:00:00.000+0100}, author = {Alnajiar, Dawood and Mitsuyama, Yukio and Hashimoto, Masanori and Onoye, Takao}, biburl = {https://www.bibsonomy.org/bibtex/2c6346ffe6bf9f50ccafd0dfac830aae6/dblp}, ee = {https://doi.org/10.1587/elex.10.20130081}, interhash = {ade1cee295f13ca0e8df17badeb26af8}, intrahash = {c6346ffe6bf9f50ccafd0dfac830aae6}, journal = {IEICE Electron. Express}, keywords = {dblp}, number = 5, pages = 20130081, timestamp = {2024-04-09T06:48:08.000+0200}, title = {PVT-induced timing error detection through replica circuits and time redundancy in reconfigurable devices.}, url = {http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee10.html#AlnajjarMHO13}, volume = 10, year = 2013 }