%0 Journal Article %1 journals/mr/MeederMAFND11 %A Meeder, Michael %A Marchut, Leslie %A Antonell, Michael J. %A Fresina, Michael T. %A Novak, Christopher E. %A Darche, Terry C. %D 2011 %J Microelectron. Reliab. %K dblp %N 2 %P 246-251 %T Application of Machine Model ESD tester to high volume capacitor reliability testing. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#MeederMAFND11 %V 51

@article{journals/mr/MeederMAFND11, added-at = {2020-02-22T00:00:00.000+0100}, author = {Meeder, Michael and Marchut, Leslie and Antonell, Michael J. and Fresina, Michael T. and Novak, Christopher E. and Darche, Terry C.}, biburl = {https://www.bibsonomy.org/bibtex/2cca28cfd52865cd9a54fc2a74bde2457/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.09.026}, interhash = {d4d35689af5edfd5bf9af17924398661}, intrahash = {cca28cfd52865cd9a54fc2a74bde2457}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 2, pages = {246-251}, timestamp = {2020-02-25T13:22:41.000+0100}, title = {Application of Machine Model ESD tester to high volume capacitor reliability testing.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#MeederMAFND11}, volume = 51, year = 2011 }