%0 Conference Paper %1 conf/vlsi-dat/YehK13 %A Yeh, Chih-Ting %A Ker, Ming-Dou %B VLSI-DAT %D 2013 %I IEEE %K dblp %P 1-4 %T Area-efficient power-rail ESD clamp circuit with SCR device embedded into ESD-transient detection circuit in a 65nm CMOS process. %U http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2013.html#YehK13 %@ 978-1-4673-4435-7

@inproceedings{conf/vlsi-dat/YehK13, added-at = {2015-09-28T00:00:00.000+0200}, author = {Yeh, Chih-Ting and Ker, Ming-Dou}, biburl = {https://www.bibsonomy.org/bibtex/2d255557b70ee0dd932498c2b43bc0ea3/dblp}, booktitle = {VLSI-DAT}, crossref = {conf/vlsi-dat/2013}, ee = {http://dx.doi.org/10.1109/VLDI-DAT.2013.6533801}, interhash = {9086a7e1d78727d60bd188a60d6cdcb1}, intrahash = {d255557b70ee0dd932498c2b43bc0ea3}, isbn = {978-1-4673-4435-7}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2015-09-29T11:36:18.000+0200}, title = {Area-efficient power-rail ESD clamp circuit with SCR device embedded into ESD-transient detection circuit in a 65nm CMOS process.}, url = {http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2013.html#YehK13}, year = 2013 }