%0 Conference Paper %1 conf/isnn/KaoTCWF17 %A Kao, Hsien-Pei %A Tung, Tzu-Chia %A Chen, Hong-Yi %A Wong, Cheng-Shih %A Fuh, Chiou-Shann %B ISNN (2) %D 2017 %E Cong, Fengyu %E Leung, Andrew Chi-Sing %E Wei, Qinglai %I Springer %K dblp %P 465-473 %T Pin Defect Inspection with X-ray Images. %U http://dblp.uni-trier.de/db/conf/isnn/isnn2017-2.html#KaoTCWF17 %V 10262 %@ 978-3-319-59081-3

@inproceedings{conf/isnn/KaoTCWF17, added-at = {2017-06-14T00:00:00.000+0200}, author = {Kao, Hsien-Pei and Tung, Tzu-Chia and Chen, Hong-Yi and Wong, Cheng-Shih and Fuh, Chiou-Shann}, biburl = {https://www.bibsonomy.org/bibtex/2d71c5e4e26e8ec8f174306c37892560a/dblp}, booktitle = {ISNN (2)}, crossref = {conf/isnn/2017-2}, editor = {Cong, Fengyu and Leung, Andrew Chi-Sing and Wei, Qinglai}, ee = {https://doi.org/10.1007/978-3-319-59081-3_54}, interhash = {e28a58f891581d2c274db6f8e7fe5d4d}, intrahash = {d71c5e4e26e8ec8f174306c37892560a}, isbn = {978-3-319-59081-3}, keywords = {dblp}, pages = {465-473}, publisher = {Springer}, series = {Lecture Notes in Computer Science}, timestamp = {2019-05-15T18:04:37.000+0200}, title = {Pin Defect Inspection with X-ray Images.}, url = {http://dblp.uni-trier.de/db/conf/isnn/isnn2017-2.html#KaoTCWF17}, volume = 10262, year = 2017 }