%0 Journal Article %1 journals/tcad/LeeW07 %A Lee, Sungjae %A Webb, Kevin J. %D 2007 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 10 %P 1782-1789 %T A Correlated Diffusion Noise Model for the Field-Effect Transistor. %U http://dblp.uni-trier.de/db/journals/tcad/tcad26.html#LeeW07 %V 26

@article{journals/tcad/LeeW07, added-at = {2020-09-24T00:00:00.000+0200}, author = {Lee, Sungjae and Webb, Kevin J.}, biburl = {https://www.bibsonomy.org/bibtex/2d7caa11bfa23784aabfae77a5deb6932/dblp}, ee = {https://doi.org/10.1109/TCAD.2007.895770}, interhash = {2c053cdb2ca1fce8120ade12c11cee8d}, intrahash = {d7caa11bfa23784aabfae77a5deb6932}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 10, pages = {1782-1789}, timestamp = {2020-09-25T11:48:41.000+0200}, title = {A Correlated Diffusion Noise Model for the Field-Effect Transistor.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad26.html#LeeW07}, volume = 26, year = 2007 }