%0 Conference Paper %1 conf/vlsid/AgrawalBKS03 %A Agrawal, Vishwani D. %A Baik, Dong Hyun %A Kim, Yong Chang %A Saluja, Kewal K. %B VLSI Design %D 2003 %I IEEE Computer Society %K dblp %P 143-148 %T Exclusive Test and its Applications to Fault Diagnosis. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2003.html#AgrawalBKS03 %@ 0-7695-1868-0

@inproceedings{conf/vlsid/AgrawalBKS03, added-at = {2023-03-24T00:00:00.000+0100}, author = {Agrawal, Vishwani D. and Baik, Dong Hyun and Kim, Yong Chang and Saluja, Kewal K.}, biburl = {https://www.bibsonomy.org/bibtex/2d7ffcdd80f353a0030a4996a37753d8f/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICVD.2003.1183128}, interhash = {3c2374f048384c8c65d4e500c30ac502}, intrahash = {d7ffcdd80f353a0030a4996a37753d8f}, isbn = {0-7695-1868-0}, keywords = {dblp}, pages = {143-148}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:18:49.000+0200}, title = {Exclusive Test and its Applications to Fault Diagnosis.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2003.html#AgrawalBKS03}, year = 2003 }