%0 Journal Article %1 journals/mr/PedersenOGPP15 %A Pedersen, Kristian Bonderup %A Østergaard, Lotte Haxen %A Ghimire, Pramod %A Popok, Vladimir N. %A Pedersen, Kjeld %D 2015 %J Microelectron. Reliab. %K dblp %N 8 %P 1196-1204 %T Degradation mapping in high power IGBT modules using four-point probing. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#PedersenOGPP15 %V 55

@article{journals/mr/PedersenOGPP15, added-at = {2023-09-30T00:00:00.000+0200}, author = {Pedersen, Kristian Bonderup and Østergaard, Lotte Haxen and Ghimire, Pramod and Popok, Vladimir N. and Pedersen, Kjeld}, biburl = {https://www.bibsonomy.org/bibtex/2dc3c74312a2d771f08ba578337f71ad9/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.05.011}, interhash = {4ee63d12ab64db44f07c42e3dd6c580d}, intrahash = {dc3c74312a2d771f08ba578337f71ad9}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 8, pages = {1196-1204}, timestamp = {2024-04-09T02:49:06.000+0200}, title = {Degradation mapping in high power IGBT modules using four-point probing.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#PedersenOGPP15}, volume = 55, year = 2015 }