%0 Conference Paper %1 conf/itc/ChenKWSRM01 %A Chen, John T. %A Khare, Jitendra %A Walker, Ken %A Shaikh, Saghir A. %A Rajski, Janusz %A Maly, Wojciech %B ITC %D 2001 %I IEEE Computer Society %K dblp %P 258-267 %T Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring. %U http://dblp.uni-trier.de/db/conf/itc/itc2001.html#ChenKWSRM01 %@ 0-7803-7169-0

@inproceedings{conf/itc/ChenKWSRM01, added-at = {2023-03-23T00:00:00.000+0100}, author = {Chen, John T. and Khare, Jitendra and Walker, Ken and Shaikh, Saghir A. and Rajski, Janusz and Maly, Wojciech}, biburl = {https://www.bibsonomy.org/bibtex/2de80a2698bd783353cd3abebdb28f630/dblp}, booktitle = {ITC}, crossref = {conf/itc/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2001.966641}, interhash = {f399cdb417a4f20845136d0398410986}, intrahash = {de80a2698bd783353cd3abebdb28f630}, isbn = {0-7803-7169-0}, keywords = {dblp}, pages = {258-267}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:56.000+0200}, title = {Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2001.html#ChenKWSRM01}, year = 2001 }