%0 Journal Article %1 journals/eswa/LiT09 %A Li, Chung-Wei %A Tzeng, Gwo-Hshiung %D 2009 %J Expert Syst. Appl. %K dblp %N 6 %P 9891-9898 %T Identification of a threshold value for the DEMATEL method using the maximum mean de-entropy algorithm to find critical services provided by a semiconductor intellectual property mall. %U http://dblp.uni-trier.de/db/journals/eswa/eswa36.html#LiT09 %V 36

@article{journals/eswa/LiT09, added-at = {2009-09-10T00:00:00.000+0200}, author = {Li, Chung-Wei and Tzeng, Gwo-Hshiung}, biburl = {https://www.bibsonomy.org/bibtex/2de9211a5cb565333e7b101851e9f97a6/dblp}, date = {2009-09-10}, description = {dblp}, ee = {http://dx.doi.org/10.1016/j.eswa.2009.01.073}, interhash = {c76c5da0d319ddd8dbbb7f579a13a9ae}, intrahash = {de9211a5cb565333e7b101851e9f97a6}, journal = {Expert Syst. Appl.}, keywords = {dblp}, number = 6, pages = {9891-9898}, timestamp = {2009-09-11T11:34:09.000+0200}, title = {Identification of a threshold value for the DEMATEL method using the maximum mean de-entropy algorithm to find critical services provided by a semiconductor intellectual property mall.}, url = {http://dblp.uni-trier.de/db/journals/eswa/eswa36.html#LiT09}, volume = 36, year = 2009 }