Article,
ESD failure signature in capacitive RF MEMS switches.
J. Ruan, G. Papaioannou, N. Nolhier, N. Mauran, M. Bafleur, F. Coccetti, and R. Plana.Microelectron. Reliab., 48 (8-9): 1237-1240 (2008)
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- article
- year
- 2008
- journal
- Microelectron. Reliab.
- number
- 8-9
- pages
- 1237-1240
- volume
- 48
- ee
- https://doi.org/10.1016/j.microrel.2008.06.035
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- http://dblp.uni-trier.de/db/journals/mr/mr48.html#RuanPNMBCP08
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- please select -%0 Journal Article
%1 journals/mr/RuanPNMBCP08
%A Ruan, Jinyu Jason
%A Papaioannou, George J.
%A Nolhier, Nicolas
%A Mauran, Nicolas
%A Bafleur, Marise
%A Coccetti, Fabio
%A Plana, Robert
%D 2008
%J Microelectron. Reliab.
%K dblp
%N 8-9
%P 1237-1240
%T ESD failure signature in capacitive RF MEMS switches.
%U http://dblp.uni-trier.de/db/journals/mr/mr48.html#RuanPNMBCP08
%V 48
@article{journals/mr/RuanPNMBCP08,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Ruan, Jinyu Jason and Papaioannou, George J. and Nolhier, Nicolas and Mauran, Nicolas and Bafleur, Marise and Coccetti, Fabio and Plana, Robert},
biburl = {https://www.bibsonomy.org/bibtex/26e1abdc03cdc65d475e65bf0e58f43fe/dblp},
ee = {https://doi.org/10.1016/j.microrel.2008.06.035},
interhash = {2e3794e6ce99bf84615f654ec0b63d41},
intrahash = {6e1abdc03cdc65d475e65bf0e58f43fe},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {8-9},
pages = {1237-1240},
timestamp = {2020-02-25T13:25:23.000+0100},
title = {ESD failure signature in capacitive RF MEMS switches.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#RuanPNMBCP08},
volume = 48,
year = 2008
}