%0 Conference Paper %1 conf/vts/WongLYW91 %A Wong, Waisum %A Liou, Juin J. %A Yuan, Jiann-Shiun %A Wu, David M. %B VTS %D 1991 %I IEEE Computer Society %K dblp %P 104-108 %T Statistical sensitivity simulation for integrating design and testing of MOSFET integrated circuits. %U http://dblp.uni-trier.de/db/conf/vts/vts1991.html#WongLYW91

@inproceedings{conf/vts/WongLYW91, added-at = {2023-03-24T00:00:00.000+0100}, author = {Wong, Waisum and Liou, Juin J. and Yuan, Jiann-Shiun and Wu, David M.}, biburl = {https://www.bibsonomy.org/bibtex/2e38a5f0d61d5819eff3cb6a5d0fa040a/dblp}, booktitle = {VTS}, crossref = {conf/vts/1991}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1991.208141}, interhash = {e13ce10a1d0f232bbe3948abe357bed0}, intrahash = {e38a5f0d61d5819eff3cb6a5d0fa040a}, keywords = {dblp}, pages = {104-108}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:10.000+0200}, title = {Statistical sensitivity simulation for integrating design and testing of MOSFET integrated circuits.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1991.html#WongLYW91}, year = 1991 }