%0 Journal Article %1 journals/scjapan/AsakawaIK03 %A Asakawa, Takeshi %A Iwasaki, Kazuhiko %A Kajihara, Seiji %D 2003 %J Syst. Comput. Jpn. %K dblp %N 3 %P 76-84 %T BIST-oriented test pattern generator for detection of transition faults. %U http://dblp.uni-trier.de/db/journals/scjapan/scjapan34.html#AsakawaIK03 %V 34

@article{journals/scjapan/AsakawaIK03, added-at = {2023-09-13T00:00:00.000+0200}, author = {Asakawa, Takeshi and Iwasaki, Kazuhiko and Kajihara, Seiji}, biburl = {https://www.bibsonomy.org/bibtex/2ed43e56b5a6fdd0426d99c414d6edba4/dblp}, ee = {https://doi.org/10.1002/scj.1196}, interhash = {f2987924e74147861836f2437ada8af5}, intrahash = {ed43e56b5a6fdd0426d99c414d6edba4}, journal = {Syst. Comput. Jpn.}, keywords = {dblp}, number = 3, pages = {76-84}, timestamp = {2024-04-09T07:24:38.000+0200}, title = {BIST-oriented test pattern generator for detection of transition faults.}, url = {http://dblp.uni-trier.de/db/journals/scjapan/scjapan34.html#AsakawaIK03}, volume = 34, year = 2003 }