%0 Journal Article %1 journals/technometrics/TianMMH17 %A Tian, Ye %A Maitra, Ranjan %A Meeker, William Q. %A Holland, Stephen D. %D 2017 %J Technometrics %K dblp %N 2 %P 247-261 %T A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images. %U http://dblp.uni-trier.de/db/journals/technometrics/technometrics59.html#TianMMH17 %V 59

@article{journals/technometrics/TianMMH17, added-at = {2018-11-14T00:00:00.000+0100}, author = {Tian, Ye and Maitra, Ranjan and Meeker, William Q. and Holland, Stephen D.}, biburl = {https://www.bibsonomy.org/bibtex/2236c67e2c6ab8ba9dbb922f91ecc1d1d/dblp}, ee = {https://www.wikidata.org/entity/Q57709222}, interhash = {2ee2c4f99ae1a85d09bccec52fab2d57}, intrahash = {236c67e2c6ab8ba9dbb922f91ecc1d1d}, journal = {Technometrics}, keywords = {dblp}, number = 2, pages = {247-261}, timestamp = {2018-11-15T14:10:31.000+0100}, title = {A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images.}, url = {http://dblp.uni-trier.de/db/journals/technometrics/technometrics59.html#TianMMH17}, volume = 59, year = 2017 }