%0 Journal Article %1 journals/ibmrd/Ludeke00 %A Ludeke, Rudolf %D 2000 %J IBM J. Res. Dev. %K dblp %N 4 %P 517-534 %T Hot-electron effects and oxide degradation in MOS structures studied with ballistic electron emission microscopy. %U http://dblp.uni-trier.de/db/journals/ibmrd/ibmrd44.html#Ludeke00 %V 44

@article{journals/ibmrd/Ludeke00, added-at = {2020-03-13T00:00:00.000+0100}, author = {Ludeke, Rudolf}, biburl = {https://www.bibsonomy.org/bibtex/2f1e84e9e7b2c9c199c54c1eff6f11eba/dblp}, ee = {https://doi.org/10.1147/rd.444.0517}, interhash = {15373a29d2956c237beae290276a042a}, intrahash = {f1e84e9e7b2c9c199c54c1eff6f11eba}, journal = {IBM J. Res. Dev.}, keywords = {dblp}, number = 4, pages = {517-534}, timestamp = {2020-03-14T11:47:12.000+0100}, title = {Hot-electron effects and oxide degradation in MOS structures studied with ballistic electron emission microscopy.}, url = {http://dblp.uni-trier.de/db/journals/ibmrd/ibmrd44.html#Ludeke00}, volume = 44, year = 2000 }