%0 Conference Paper %1 conf/ats/SakataTSO99 %A Sakata, Takahide %A Takahashi, Hideyuki %A Sekine, Tetsu %A Ogiwara, Toshiya %B Asian Test Symposium %D 1999 %I IEEE Computer Society %K dblp %P 389-393 %T Investigation of Ga Contamination Due to Analysis by Dual Beam FIB. %U http://dblp.uni-trier.de/db/conf/ats/ats1999.html#SakataTSO99 %@ 0-7695-0315-2

@inproceedings{conf/ats/SakataTSO99, added-at = {2023-03-24T00:00:00.000+0100}, author = {Sakata, Takahide and Takahashi, Hideyuki and Sekine, Tetsu and Ogiwara, Toshiya}, biburl = {https://www.bibsonomy.org/bibtex/2f208720a108c862127cf9cb82316709c/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1999}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1999.810780}, interhash = {7c35d2260d2c5e42aa5fb39dc49d5e81}, intrahash = {f208720a108c862127cf9cb82316709c}, isbn = {0-7695-0315-2}, keywords = {dblp}, pages = {389-393}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:07.000+0200}, title = {Investigation of Ga Contamination Due to Analysis by Dual Beam FIB.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1999.html#SakataTSO99}, year = 1999 }