%0 Conference Paper %1 conf/isvlsi/KouR14 %A Kou, Lingbo %A Robinson, William H. %B ISVLSI %D 2014 %I IEEE Computer Society %K dblp %P 214-219 %T Impact of Process Variations on Reliability and Performance of 32-nm 6T SRAM at Near Threshold Voltage. %U http://dblp.uni-trier.de/db/conf/isvlsi/isvlsi2014.html#KouR14 %@ 978-1-4799-3763-9

@inproceedings{conf/isvlsi/KouR14, added-at = {2023-03-24T00:00:00.000+0100}, author = {Kou, Lingbo and Robinson, William H.}, biburl = {https://www.bibsonomy.org/bibtex/2a2ecfdc470e607fa618ffab2b429b4c9/dblp}, booktitle = {ISVLSI}, crossref = {conf/isvlsi/2014}, ee = {https://doi.ieeecomputersociety.org/10.1109/ISVLSI.2014.73}, interhash = {2f32d1098b166003bf1e5339fe88a236}, intrahash = {a2ecfdc470e607fa618ffab2b429b4c9}, isbn = {978-1-4799-3763-9}, keywords = {dblp}, pages = {214-219}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T11:07:29.000+0200}, title = {Impact of Process Variations on Reliability and Performance of 32-nm 6T SRAM at Near Threshold Voltage.}, url = {http://dblp.uni-trier.de/db/conf/isvlsi/isvlsi2014.html#KouR14}, year = 2014 }